Test Probe B for IP2X testing ( Jointed Test Finger )

Test probe b is design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2.

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Description

Test Probe B for IP2X testing ( jointed test finger )

1. Introduction:

Test probe B ( jointed test finger) is design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2.

Test probe B with 10N force is for IP2X testing, it means for the protection of person’s finger from hazard parts.

2. Specification

Diameter of dactylogryposis: 12mm Length of dactylogryposis: 80mm
Diameter of baffle: 50mm Length of baffle: 100mm
Thruster (optional) 10N
Material: Insulating material (baffle and handle), metal(dactylogryposis)

3. IP code Test Probe Kits:

Test Probe A for IP10 Testing:Φ50 sphere with handle

Test Probe B for IP20 Testing: jointed test finger

Test probe C for IP30 Testing: Φ2.5 rod-length 100

Test Probe D for IP40 Testing:Φ1.0 wire-length 100

Test Probe 1 for IP10 Testing: 500g steel sphere

Test Probe 2 for IP20 Testing: 15g steel sphere

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